International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064

Downloads: 110 | Views: 296

Research Paper | Electronics & Communication Engineering | India | Volume 3 Issue 8, August 2014 | Rating: 6.3 / 10


Leakage Power Reduction in CMOS XOR Full Adder Using Power Gating With GDI Technique

Piyush Sharma [3] | Ghanshyam Jangid [6]


Abstract: As technology scales into the nanometre regime leakage current, active power, delay and area are becoming important metric for the analysis and design of complex arithmetic logic circuits. low leakage 1bit full adder cells are proposed for mobile application, gated-diffusion input (GDI) technique have been introduced for further reduction in power.


Keywords: Power gating, GDI, 1-bit full adder, Sequential circuit, sleep transistors


Edition: Volume 3 Issue 8, August 2014,


Pages: 1731 - 1733

Rate this Article


Select Rating (Lowest: 1, Highest: 10)

5

Your Comments

Characters: 0

Your Full Name:


Your Valid Email Address:


Verification Code will appear in 2 Seconds ... Wait

Top