Rate the Article: Efficient Hardware Utilization for Functional Broadside Test to Achieve High Fault Coverage, IJSR, Call for Papers, Online Journal
International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064

Downloads: 104 | Views: 406

M.Tech / M.E / PhD Thesis | Electronics & Communication Engineering | India | Volume 3 Issue 9, September 2014 | Rating: 6.7 / 10


Efficient Hardware Utilization for Functional Broadside Test to Achieve High Fault Coverage

P. Durga Venkata Prasad, K. Tirumala Rao


Abstract: Functional broadside tests are two-pattern scan-based tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. On-chip test generation has the added advantage that it reduces test data volume and facilitates at-speed test application. This paper shows that on-chip generation of functional broadside tests can be done using simple hardware, and can achieve high transition fault coverage forte stable circuits. With the proposed on-chip test generation method, the circuit is used for generating reachable states during test application. This alleviates the need to compute reachable states off-line


Keywords: Built-in test generation, functional broadside tests, reachable states, transition faults


Edition: Volume 3 Issue 9, September 2014,


Pages: 1938 - 1943



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