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M.Tech / M.E / PhD Thesis | Electronics & Communication Engineering | India | Volume 5 Issue 5, May 2016
Realization of Programmable PRPG with Enhanced Fault Coverage Gradient
Lakshmi Asokan | Jeena Maria Cherian
Abstract: This paper describes a low power programmable pseudorandom pattern generator with desired toggling level and also enhanced fault coverage compared with other BIST based on PRPG. It comprised of finite state machine LFSR driving a phase shifter and it allows the device to produce binary sequence with preselected toggling activity. Generator is automatically controlled providing easy and precise tuning. Furthermore, this paper introduces a test compression method to avoid repeated pattern generation for testing the same device. The main highlight of this paper is to reduce the test data volume and test data memory.
Keywords: BIST, low power test, PRPG, test data volume compression
Edition: Volume 5 Issue 5, May 2016,
Pages: 2286 - 2288
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Research Paper, Electronics & Communication Engineering, India, Volume 4 Issue 5, May 2015
Pages: 2561 - 2564Statistical Simulation for BIST Architecture using Cognitive Principles
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Case Studies, Electronics & Communication Engineering, India, Volume 4 Issue 2, February 2015
Pages: 1937 - 1941Re-Configurable Built In Self Repair scheme in Ram for Yield Improvement
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