International Journal of Science and Research (IJSR)

International Journal of Science and Research (IJSR)
Call for Papers | Fully Refereed | Open Access | Double Blind Peer Reviewed

ISSN: 2319-7064


Downloads: 110 | Views: 308

Research Paper | Electronics & Communication Engineering | India | Volume 3 Issue 8, August 2014 | Popularity: 6.3 / 10


     

Leakage Power Reduction in CMOS XOR Full Adder Using Power Gating With GDI Technique

Piyush Sharma, Ghanshyam Jangid


Abstract: As technology scales into the nanometre regime leakage current, active power, delay and area are becoming important metric for the analysis and design of complex arithmetic logic circuits. low leakage 1bit full adder cells are proposed for mobile application, gated-diffusion input (GDI) technique have been introduced for further reduction in power.


Keywords: Power gating, GDI, 1-bit full adder, Sequential circuit, sleep transistors


Edition: Volume 3 Issue 8, August 2014


Pages: 1731 - 1733



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Piyush Sharma, Ghanshyam Jangid, "Leakage Power Reduction in CMOS XOR Full Adder Using Power Gating With GDI Technique", International Journal of Science and Research (IJSR), Volume 3 Issue 8, August 2014, pp. 1731-1733, URL: https://www.ijsr.net/getabstract.php?paperid=2015837, DOI: https://www.doi.org/10.21275/2015837



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