Downloads: 104 | Views: 291

M.Tech / M.E / PhD Thesis | Electronics & Communication Engineering | India | Volume 3 Issue 9, September 2014 | Popularity: 6.7 / 10

Rate This Article!      

Efficient Hardware Utilization for Functional Broadside Test to Achieve High Fault Coverage

P. Durga Venkata Prasad, K. Tirumala Rao

Abstract: Functional broadside tests are two-pattern scan-based tests that avoid over testing by ensuring that a circuit traverses only reachable states during the functional clock cycles of a test. On-chip test generation has the added advantage that it reduces test data volume and facilitates at-speed test application. This paper shows that on-chip generation of functional broadside tests can be done using simple hardware, and can achieve high transition fault coverage forte stable circuits. With the proposed on-chip test generation method, the circuit is used for generating reachable states during test application. This alleviates the need to compute reachable states off-line

Keywords: Built-in test generation, functional broadside tests, reachable states, transition faults

Edition: Volume 3 Issue 9, September 2014

Pages: 1938 - 1943

Make Sure to Disable the Pop-Up Blocker of Web Browser

Click to Cite this Article

Similar Articles