Reliability Computation of System Reliability for the New Rayleigh Pareto Distribution

P. Jyothi

Abstract: In this paper presents the reliability computation of system reliability when the applied stress and strength follows the New Rayleigh Pareto distribution. The New Rayleigh Pareto Distribution (NRPD) is considered as a simple model to make component reliability and may place a good fit for failure data and also provide more appropriate information about hazard rate. The results may be applied to semiconductor devices. Maximum likelihood estimator are used here.

Keywords: The New Rayleigh Pareto distribution, Reliability ComputationStress Strength Model, Maximum Likelihood Estimator