Leakage Reduction Technique for Scan Flip-Flop

Nayini Bhavani, Rahul D, Bhavani Kiranmai, J. Yeshwanth Reddy

Abstract: Scanning of test vectors during testing causes unnecessary and excessive switching in the combinational circuit compared to that in the normal mode of operation. In proposed system we have created a scan flip-flop based on MTcmos for leakage reduction which eliminates the power consumed due to unnecessary switching in the combinational circuit during scan shift, with a little impact on its performance. Multi-threshold CMOS (MTCMOS) power gating is a design technique in which a power gating transistor is connected between the logic transistors and either power or ground, thus creating a virtual supply rail or virtual ground rail, respectively, the new scan flip-flop by using sleep transistors it will reduce the leakage.

Keywords: Sequential circuit, MTCMOS, ATPG, CUT, Leakage current, scan flop

How to Cite?: Nayini Bhavani, Rahul D, Bhavani Kiranmai, J. Yeshwanth Reddy, "Leakage Reduction Technique for Scan Flip-Flop", Volume 11 Issue 5, May 2022, International Journal of Science and Research (IJSR), Pages: 1837-1841, https://www.ijsr.net/getabstract.php?paperid=SR22512143826, DOI: https://dx.doi.org/10.21275/SR22512143826

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